| Paper: | TA-P6.6 |
| Session: | Image Scanning, Display, Printing, Color and Multispectral Processing II |
| Time: | Tuesday, September 18, 09:50 - 12:30 |
| Presentation: |
Poster
|
| Title: |
A MUTUAL INFORMATION BASED AUTOMATIC REGISTRATION AND ANALYSIS ALGORITHM FOR DEFECT IDENTIFICATION IN PRINTED DOCUMENTS |
| Authors: |
Kartheek Chandu; Rochester Institute of Technology | | |
| | Eli Saber; Rochester Institute of Technology | | |
| | Wencheng Wu; Xerox Corporation | | |
| Abstract: |
In this paper, we propose a defect analysis system, which automatically aligns a digitized copy of a printed output to a reference electronic original and subsequently illustrates potential image quality artifacts. We focus on image defects or artifacts caused by shortfalls in mechanical or electro-photographic processes. In this method, log-polar transform and mutual information techniques are used for image registration. A confidence map is then calculated by comparing the contrast and entropy of the neighborhood for each pixel in both images. This confidence map results in a qualitative difference between printed documents and electronic originals. The algorithm was demonstrated successfully on a database of 94 images with 95.7% accuracy. |
